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Frontier Optoelectronic Materials Lab.
前瞻光電材料實驗室
Analytical facilities
 Atomic force microscopy |  Contact angle measurement |
|---|---|
 Dynamic light scattering |  Electroluminescence measurement system |
 Fluorecence spectrophotometer |  FTIR spectrometer |
 FTPS-EQE |  Impedance measurement system |
 Indoor solar simulator |  Kelvin probe measurement system |
 Linear dynamic range measurement |  Paios system |
 Photostability testing platform |  Photo-response measurement platform |
 Photoluminescence mapping system |  PLQY test system |
 Quantum Efficiency Measurement Systemp |  Raman Spectrometer System |
 Scanning electron microscope-1 |  Solar simulator |
 Spectroscopic ellipsometer |  Transient photoluminescence measurement system |
 UV-visible spectrophotometer |  X-ray Diffractometer |
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