top of page
Frontier Optoelectronic Materials Lab.
前瞻光電材料實驗室
Analytical facilities
Analytical facilities
Analytical facilities
![]() Atomic force microscopy | ![]() Contact angle measurement |
---|---|
![]() Dynamic light scattering | ![]() Electroluminescence measurement system |
![]() Fluorecence spectrophotometer | ![]() FTIR spectrometer |
![]() FTPS-EQE | ![]() Impedance measurement system |
![]() Indoor solar simulator | ![]() Kelvin probe measurement system |
![]() Linear dynamic range measurement | ![]() Paios system |
![]() Photostability testing platform | ![]() Photo-response measurement platform |
![]() Photoluminescence mapping system | ![]() PLQY test system |
![]() Quantum Efficiency Measurement Systemp | ![]() Raman Spectrometer System |
![]() Scanning electron microscope-1 | ![]() Solar simulator |
![]() Spectroscopic ellipsometer | ![]() Transient photoluminescence measurement system |
![]() UV-visible spectrophotometer | ![]() X-ray Diffractometer |
bottom of page